Толық библиографиялық жазба
Korobova N., Puzikova D., Os’makova N. Residual Stresses and Cracking in Metal/Al2O3-SiO2 Systems for Microelectronics Packaging// International Journal of mathematics and physics.-2010. - №3.– С. 17-25
Пузикова Дарья Сергеевна
Korobova N., Puzikova D., Os’makova N. Residual Stresses and Cracking in Metal/Al2O3-SiO2 Systems for Microelectronics Packaging// International Journal of mathematics and physics.-2010. - №3.– С. 17-25